{"id":26762,"date":"2021-08-25T06:07:20","date_gmt":"2021-08-25T11:07:20","guid":{"rendered":"https:\/\/alpha.ljcreate.com\/product\/sin%20categor\u00eda\/semiconductors-2-study-module\/"},"modified":"2023-07-05T16:48:00","modified_gmt":"2023-07-05T15:48:00","slug":"semiconductors-2-study-module","status":"publish","type":"product","link":"https:\/\/ljcreate.com\/es\/engineering\/semiconductors-2-study-module\/","title":{"rendered":"M\u00f3dulo de estudio de semiconductores 2"},"content":{"rendered":"<h5>M\u00f3dulo de estudio de semiconductores 2 (302-22) &#8211; las actividades t\u00edpicas incluyen:<\/h5>\n<ul>\n<li>Mida voltajes y corrientes de CC en un par Darlington<\/li>\n<li>Mida los voltajes y determine la impedancia de entrada de un par Darlington en condiciones de CA<\/li>\n<li>Identificar la distorsi\u00f3n cruzada y los m\u00e9todos de prevenci\u00f3n.<\/li>\n<li>Determine mediante c\u00e1lculo y medici\u00f3n corrientes y voltajes de CC en un circuito disipador de corriente constante<\/li>\n<li>Mida el rendimiento del amplificador de CC en condiciones de CA<\/li>\n<li>Reconocer las caracter\u00edsticas importantes de un amplificador de CC<\/li>\n<li>Obtenga par\u00e1metros JFET mediante la medici\u00f3n de voltajes y corrientes en un circuito JFET<\/li>\n<li>Circuitos semiconductores de detecci\u00f3n de fallas<\/li>\n<\/ul>\n<p>Tenga en cuenta que este recurso requiere acceso a una plataforma de experimentos (300-01).<\/p>\n","protected":false},"excerpt":{"rendered":"<p>M\u00f3dulo de estudio de semiconductores 2 (302-22) &#8211; las actividades t\u00edpicas incluyen: Mida voltajes y corrientes de CC en un par Darlington Mida los voltajes y determine la impedancia de entrada de un par Darlington en condiciones de CA Identificar la distorsi\u00f3n cruzada y los m\u00e9todos de prevenci\u00f3n. Determine mediante c\u00e1lculo y medici\u00f3n corrientes y&hellip;<\/p>\n","protected":false},"featured_media":20600,"template":"","meta":{"_acf_changed":false,"inline_featured_image":false},"product_brand":[],"product_cat":[58,108,80,126,138,139],"product_tag":[],"class_list":{"0":"post-26762","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-engineering","7":"product_cat-advanced-electronics-systems","8":"product_cat-engineering-uk","9":"product_cat-advanced-electronics-system","10":"product_cat-engineering-es","11":"product_cat-advanced-electronics-system-es","13":"first","14":"instock","15":"shipping-taxable","16":"product-type-simple"},"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.1.1 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>M\u00f3dulo de estudio de semiconductores 2 | LJ Create<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/ljcreate.com\/es\/engineering\/semiconductors-2-study-module\/\" \/>\n<meta property=\"og:locale\" content=\"es_ES\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"M\u00f3dulo de estudio de semiconductores 2 | LJ Create\" \/>\n<meta property=\"og:description\" content=\"M\u00f3dulo de estudio de semiconductores 2 (302-22) &#8211; las actividades t\u00edpicas incluyen: Mida voltajes y corrientes de CC en un par Darlington Mida los voltajes y determine la impedancia de entrada de un par Darlington en condiciones de CA Identificar la distorsi\u00f3n cruzada y los m\u00e9todos de prevenci\u00f3n. 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